^{yuval Sadeh}

Gregoriy Kaplan

David J. Bonfil

Offer Rozenstein

Spatial information embedded in a crop model can improve yield prediction. Leaf area index (LAI) is a well-known crop variable often estimated from remote-sensing data and used as an input into crop models. In this study, we evaluated the assimilation of LAI derived from high-resolution (both spatial and temporal) satellite imagery into a mechanistic crop model, a simple algorithm for yield estimate (SAFY), to assess the within-field crop yield. We tested this approach on spring wheat grown in Israel. Empirical LAI models were derived from the biophysical processor for Sentinel-2 LAI and spectral vegetation indices from Sentinel-2 and PlanetScope images. The predicted grain yield obtained from the SAFY model was compared against the harvester’s yield map. LAI derived from PlanetScope and Sentinel-2 fused images achieved higher yield prediction (RMSE = 69 g/m²) accuracy than that of Sentinel-2 LAI (RMSE = 88 g/m²). Even though the spatial yield estimation was only moderately correlated to the ground truth (R² = 0.45), this is consistent with current studies in this field, and the potential to capture within-field yield variations using high-resolution imagery has been demonstrated. Accordingly, this is the first application of PlanetScope and Sentinel-2 images conjointly used to obtain a high-density time series of LAI information to model within-field yield variability.